Serial Thick Section Gas Cluster Ion Beam Scanning Electron Microscopy

نویسندگان
چکیده

برای دانلود باید عضویت طلایی داشته باشید

برای دانلود متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

منابع مشابه

Serial section scanning electron microscopy of adult brain tissue using focused ion beam milling.

Introduction Analyzing the synaptic basis of neuronal circuits within a volume of brain tissue requires electron microscopy. With a resolution capable of seeing the smallest syn-aptic contacts, this method uses different sectioning techniques to produce serial images suitable for seeing the ultrastruc-ture within significant volumes of brain tissue. Sections are cut from a block of tissue, leav...

متن کامل

Scanning-beam electron microscopy of Mycoplasma pneumoniae.

The morphology and the existence of a growth cycle of Mycoplasma pneumoniae have not been clearly established. There is disagreement as to whether this organism exists as a spherical or filamentous form, and whether it progresses from filamentous to spherical forms as the organism ages. A scanning-beam electron microscope (SEM) was utilized to provide detailed observations of the cycle of morph...

متن کامل

“Smart Microscopy”: Feature Based Adaptive Sampling for Focused Ion Beam Scanning Electron Microscopy

A new method for the image acquisition in scanning electron microscopy (SEM) was introduced. The method used adaptively increased pixel-dwell times to improve the signal-to-noise ratio (SNR) in areas of high detail. In areas of low detail, the electron dose was reduced on a per pixel basis, and a-posteriori image processing techniques were applied to remove the resulting noise. The technique wa...

متن کامل

Correlative analysis of immunoreactivity in confocal laser-scanning microscopy and scanning electron microscopy with focused ion beam milling

Recently, three-dimensional reconstruction of ultrastructure of the brain has been realized with minimal effort by using scanning electron microscopy (SEM) combined with focused ion beam (FIB) milling (FIB-SEM). Application of immunohistochemical staining in electron microscopy (EM) provides a great advantage in that molecules of interest are specifically localized in ultrastructures. Thus, we ...

متن کامل

IPrep – Automated Serial-Section Broad-Ion-Beam Tomography

Tomographic reconstruction of a wide range of materials and biological samples can be accomplished via serial-section broad-ion-beam tomography (SSBIB) – alternately ion-polishing away material and imaging the remaining polished surface with optical or scanning electron microscopy (SEM) [1]. Under computer control it is practical to acquire 2-D images of hundreds of sections without user interv...

متن کامل

ذخیره در منابع من


  با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید

ژورنال

عنوان ژورنال: Microscopy and Microanalysis

سال: 2018

ISSN: 1431-9276,1435-8115

DOI: 10.1017/s1431927618007705